000 00394nam a2200169Ia 4500
003 0STCL
008 150530s9999 xx 000 0 und d
040 _aSTCL
_cSTCL
100 _aSimpson, A.
245 _aTesting methods and reliability electronics
250 _aFirst
260 _bMacmillan
_c1976
546 _aEnglish
942 _2ddc
_cBK
999 _c30639
_d30639
005 20220125170210.0